This website or third-party tools used in this make use of cookies required to operate and useful for the purposes described in the Cookie Policy.
If you want to know more please see our Cookie Policy.
Modular System for Crimp Cross-Sectional Analysis.
SawInspect System 6
See Product
The SawInspect System 6 (SIS 6) is an extremely compact device for crimp cross section analysis. It’s the only one of its kind that combines three different highlights:
The precision cutting of the SPU 6
The high quality microscope of the MZU 1.3
The electrolyte staining of the ESU 6
Within a few quick steps, users can create cross sectioned samples. The individual sample is placed in the holder and aligned with the saw blade. The unique blade provides a cut that does not require polishing after the sample is cut. After cutting, the sample holder is quickly moved from the blade to the microscope with the use of guide rails.