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Micrograph Systems | |
MicroGraph System MGS
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Modular System for Crimp Cross-Sectional Analysis.
SawInspect System 6
See Product
The SawInspect System 6 (SIS 6) is an extremely
compact device for crimp cross section analysis. It’s the only one
of its kind that combines three different highlights:
The individual sample is placed in the holder and aligned with the saw blade. The unique blade provides a cut that does not require polishing after the sample is cut. After cutting, the sample holder
is quickly moved from the blade to the microscope with the use of guide rails.
compact device for crimp cross section analysis. It’s the only one
of its kind that combines three different highlights:
- The precision cutting of the SPU 6
- The high quality microscope of the MZU 1.3
- The electrolyte staining of the ESU 6
The individual sample is placed in the holder and aligned with the saw blade. The unique blade provides a cut that does not require polishing after the sample is cut. After cutting, the sample holder
is quickly moved from the blade to the microscope with the use of guide rails.
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